[mat-dev] Improved Memory Testing

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[mat-dev] Improved Memory Testing

From: "Tsvetkov, Krum" <krum.tsvetkov@xxxxxxx>
Date: Wed, 22 Dec 2010 17:00:48 +0100
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Hi,

There is a discussion going on in bug https://bugs.eclipse.org/bugs/show_bug.cgi?id=331776 which I think can be interesting for the people on this list.

In the bug we discuss some ideas if and how heap dumps and analysis with MAT based tools can be used within tests to for example measure memory consumption of certain components, to assert there are exactly N instances of a certain type, etc…

Further ideas and comments are welcome.

Krum

Krum Tsvetkov
SAP AG
www.sap.com

http://www.sap.com/company/legal/impressum.epx

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